Photovoltaic industry (solar power industry) After 50 years of solar cell development, it finally crossed the historical watershed in 2004 and officially entered the take-off stage. With the German government promulgating the Renewable Energy Law on January 1, 2004, solar energy was selected as the main alternative energy source, and practical measures were adopted to popularize solar power generation. (The government not only subsidizes private installation of solar modules, but also guarantees the purchase of electricity at a certain rate. The solar cell industry officially entered a period of rapid growth in demand.
With the continuous development and improvement of polysilicon, silicon wafer, and solar energy solar panel technology, the photovoltaic industry has increasingly higher requirements for the inspection of wafer quality. Due to the fact that foreign optical inspection is too expensive, it is a big expenditure for non-raw material manufacturers, and it needs to detect the incoming silicon wafers. In view of this situation, Shanghai Sunwell Optoelectronics Technology Co., Ltd. has developed solar wafers for solar cells. Detection system. The system can be used to analyze the distribution of micro-morphology of the "pyramid" of silicon wafers for solar cells, as well as the defect analysis of silicon wafer suede. For example, silicon wafer inspection microscope can observe dislocations, scratches, and chipping that are difficult to observe with the naked eye. It can also analyze the impurities and residues of silicon wafers. Impurities include: particles, organic impurities, inorganic impurities, metal ions, silicon powder dust, etc., resulting in silicon wafers after polishing are prone to change, blue, black Such phenomenon, making the grinding disc failed. It is one of the necessary testing instruments in the production process of solar cell silicon wafers. The LW300MT silicon microscopy microscope produced by Shanghai Sunwell is suitable for microscopic observation of solar cell wafers. The instrument is equipped with a large moving range stage, an epi-illuminator, an achromatic objective lens with a long working distance, an eyepiece with a large field of view, a clear image, a good contrast, a polarizing device, and a high-resolution digital camera. This instrument is equipped with a dark field objective lens, which makes the image more clear when observing a silicon wafer. It is an ideal instrument for detecting the distribution of the microscopic morphology of the “pyramid” of the solar cell silicon wafer and the defect analysis of the silicon wafer.
Inkjet Receptive Coating, Anticorrosion Pigments, Matting Agent
